VLSI Design and Test: 22nd International Symposium VDAT 2018 Madurai India June 28-30 2018 Revised Selected Papers

VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 201
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces. Categories:
Computers – Hardware
Year:
2019
Edition:
1st ed.
Publisher:
Springer Singapore
Language:
english
Pages:
728
ISBN 10:
9811359504
ISBN 13:
9789811359507
Series:
Communications in Computer and Information Science 892
File:
895 MB