VLSI Design and Test: 21st International Symposium VDAT 2017 Roorkee India June 29 – July 2 2017 Revised Selected Papers

VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (eds.)
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 201
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. Categories:
Computers – Hardware
Year:
2017
Edition:
1
Publisher:
Springer Singapore
Language:
english
Pages:
820
ISBN 10:
9811074704
ISBN 13:
9789811074707
Series:
Communications in Computer and Information Science 711
File:
946 MB